Surface Science Lab – University of Patras
- Specialized surface characterization measurements on samples of homogeneous solid materials and thin films supported on surfaces of solid materials. The surface characterization, at a depth of 0-10nm, includes elemental analysis (qualitative and quantitative) and, where appropriate, structure and electronic properties of the analyzed area, as well as the thickness of the films.
- Note: Elemental surface analysis with X-ray photoelectron spectroscopy (XPS) is accredited by ISO17025 by the ESYD (No. 660 / 12-3-2010)
Contact Person – Scientific Director
Prof. S. Ladas